| 000 -LEADER |
|---|
| fixed length control field |
00434pam a2200145a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160510b xxu||||| |||| 00| 0 eng d |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
NASA CR-721 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
LOMBARDI,J,MCDONOUGH,L |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
HIGH RELIABILITY SCREENING OF SEMICONDUCTOR AND INTEGRATED CIRCUIT DEVICES |
| Remainder of title |
|
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
|
| Name of publisher, distributor, etc. |
NASA, WASHINGTON, D.C. |
| Date of publication, distribution, etc. |
1967 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
,150,,,,,, |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Bound with NASA CR-722-725 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Geological |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
PADDEN,H |
