POWER-CONSTRAINED TESTING OF VLSI CIRCUITS
By: Nicolici,Nicola.
Contributor(s): Al-Hashimi,Bashir M.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | url | Copy number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|---|
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.3950287 N545P (Browse shelf) | Book Request | s | Available | A148129 |
Total holds: 0
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