621.3950287 / N545P
Nicolici,Nicola
POWER-CONSTRAINED TESTING OF VLSI CIRCUITS / .- Kluwer Academic Publishers, Boston, 2003 .- x,178 .
ISBN: 140207235X
Subject Headings:
Integrated Circuits, Very Large Scale Integration -- Testing;
Semiconductors -- Thermal Properties;
Author Added Entry:
Al-Hashimi,Bashir M;
Copy Details:
Acc. No.: A148129, Full Call No.: 621.3950287 N545P, (s) Item type: Books , Location: COMPACT STORAGE (BASEMENT),
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Nicolici,Nicola
POWER-CONSTRAINED TESTING OF VLSI CIRCUITS / .- Kluwer Academic Publishers, Boston, 2003 .- x,178 .
ISBN: 140207235X
Subject Headings:
Integrated Circuits, Very Large Scale Integration -- Testing;
Semiconductors -- Thermal Properties;
Author Added Entry:
Al-Hashimi,Bashir M;
Copy Details:
Acc. No.: A148129, Full Call No.: 621.3950287 N545P, (s) Item type: Books , Location: COMPACT STORAGE (BASEMENT),
------------------------- --------------------- ------ --------- ------- ------- --------- --------