ATOMIC FORCE MICROSCOPY, SCANNING NEARFIELD OPTICAL MICROSCOPY AND NANOSCRATCHING
By: Kaupp,G.
Material type:
BookPublisher: Springer-Verlag, Berlin 2006Description: xii,292.ISBN: 3540284052.Subject(s): Atomic Force MicroscopyDDC classification: 502.82 | K166A
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 502.82 K166A (Browse shelf) | Available | A156436 |
Total holds: 0
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