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ATOMIC FORCE MICROSCOPY, SCANNING NEARFIELD OPTICAL MICROSCOPY AND NANOSCRATCHING (Record no. 358091)

000 -LEADER
fixed length control field 00495pam a2200157a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160408b2006 xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 3540284052
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 502.82
Item number K166A
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kaupp,G.
245 1# - TITLE STATEMENT
Title ATOMIC FORCE MICROSCOPY, SCANNING NEARFIELD OPTICAL MICROSCOPY AND NANOSCRATCHING
Statement of responsibility, etc. APPLICATION TO ROUGH AND NATURAL SURFACES
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.
Name of publisher, distributor, etc. Springer-Verlag, Berlin
Date of publication, distribution, etc. 2006
300 ## - PHYSICAL DESCRIPTION
Extent xii,292
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Atomic Force Microscopy
964 ## -
-- CIRC
997 ## -
-- A156436 C
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Permanent Location Current Location Date acquired Full call number Barcode Date last seen Price effective from Koha item type
        General Stacks PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 2007-08-12 502.82 K166A A156436 2016-04-08 2016-04-08 Books

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