Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

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1. TESTING AND RELIABLE DESING OF CMOS CIRCUITS

by Jha, Niraj K | Kundu, Sandip.

Material type: book Book Description: xiii,231.Publisher: Boston Kluwer Academic Pub. c1990Availability: Items available for reference: PK Kelkar Library, IIT Kanpur [Call number: 621.39732 J559t] (1).

2. Nanoelectronic circuit design

by | Jha, Niraj K., Ed.

Material type: book Book; Format: print ; Literary form: not fiction Description: xi, 485p.Publisher: New York Springer 2011Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.5 N157] (1).

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