X- ray optics and X-ray microanalysis
Contributor(s): Pattee, H. H. [ed.] | Cosslett, V. E. [ed.] | Engstrom, Arne [ed.].
Publisher: Academic Press New York 1963Description: 622p.Subject(s): X-ray opticsDDC classification: 578 | Sy6x 1963 v.3Item type | Current location | Collection | Call number | url | Copy number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 578 Sy6x (Browse shelf) | Book Request | v. 3 | Available | 55017 |
Total holds: 0
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