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X- ray optics and X-ray microanalysis (Record no. 455264)

000 -LEADER
fixed length control field 00554 a2200193 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20170228115318.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 170228b xxu||||| |||| 00| 0 eng d
040 ## - CATALOGING SOURCE
Transcribing agency IITK
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 578
Item number Sy6x 1963 v.3
245 1# - TITLE STATEMENT
Title X- ray optics and X-ray microanalysis
Statement of responsibility, etc edited by H. H. Pattee, V. E. Cosslett and Arne Engstrom
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Year of publication 1963
Place of publication Academic Press
Name of publisher New York
300 ## - PHYSICAL DESCRIPTION
Number of Pages 622p
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term X-ray optics
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Pattee, H. H. [ed.]
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Cosslett, V. E. [ed.]
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Engstrom, Arne [ed.]
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Permanent Location Current Location Date acquired Full call number Accession Number Copy number Uniform Resource Identifier Koha item type
        COMPACT STORAGE (BASEMENT) PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 2007-08-12 578 Sy6x 55017 v. 3 Book Request Books

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