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Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

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1.
Digital noise monitoring of defect origin

by Aliev, Telman.

Material type: book Book; Format: print ; Literary form: not fiction Description: xii, 223p.Publisher: New York Springer Science+Business Media 2007Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3 Al42d] (1).

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2.
Digital Noise Monitoring of Defect Origin : [electronic resource] /

by Aliev, Telman [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XII, 224 p. online resource.Publisher: Boston, MA : Springer US, 2007.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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