Digital Noise Monitoring of Defect Origin
By: Aliev, Telman [author.].
Contributor(s): SpringerLink (Online service).
Material type:
BookPublisher: Boston, MA : Springer US, 2007.Description: XII, 224 p. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9780387717548.Subject(s): Engineering | Applied mathematics | Engineering mathematics | Electrical engineering | Engineering | Signal, Image and Speech Processing | Applications of Mathematics | Communications Engineering, Networks | Electrical EngineeringDDC classification: 621.382 Online resources: Click here to access online | Item type | Current location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
E books
|
PK Kelkar Library, IIT Kanpur | Available | EBK9828 |
Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features -- Position-Binary Technology of Monitoring Defect at its Origin -- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin -- Robust Correlation Monitoring of a Defect at its Origin -- Spectral Monitoring of a Defect's Origin -- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier -- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.
Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.
There are no comments for this item.