PKK Library catalog › Results of search for 'au:"Ahmed, Nisar"'

	1.	Nanometer technology designs high-quality delay tests by Tehranipoor, Mohammad \| Ahmed, Nisar. Material type: Book; Format: print ; Literary form: not fiction Description: xvii, 281p.Publisher: New York Springer 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381548 T233n] (1). Place hold Add to cart (remove)
	2.	Nanometer Technology Designs High-Quality Delay Tests : [electronic resource] / by Tehranipoor, Mohammad [author.] \| Ahmed, Nisar [author.] \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: not fiction Description: XVIII, 281 p. 140 illus. online resource.Publisher: Boston, MA : Springer US, 2008.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1). Place hold Add to cart (remove)

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