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Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis [NASA TN D-3658]

By: Norris, L. Fredrick.
Contributor(s): Norris, L. Fredrick | Cremens, Walter S | Weeton, John W.
Material type: materialTypeLabelBookSeries: National Aeronautics and Space Administration (NASA). Publisher: Washington, D.C. National Aeronautics and Space Administration 1966Description: 6p.Subject(s): Overlay copy technique
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Item type Current location Collection Call number Status Date due Barcode Item holds
Technical Report Technical Report PK Kelkar Library, IIT Kanpur
COMPACT STORAGE (BASEMENT) Reference 67640 [D-3658]
Total holds: 0

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