| 000 -LEADER |
|---|
| fixed length control field |
00771nam a22002177a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20210318170855.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
210318b xxu||||| |||| 00| 0 eng d |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
IIT Kanpur |
| 041 ## - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
eng |
| 100 ## - MAIN ENTRY--AUTHOR NAME |
|---|
| Personal name |
Norris, L. Fredrick |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis [NASA TN D-3658] |
| Statement of responsibility, etc |
L. Fredrick Norris, Walter S. Cremens and Jhon W. Weeton |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication |
Washington, D.C. |
| Name of publisher |
National Aeronautics and Space Administration |
| Year of publication |
1966 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Number of Pages |
6p |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
National Aeronautics and Space Administration (NASA) |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Overlay copy technique |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Norris, L. Fredrick |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Cremens, Walter S |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Weeton, John W |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Reference |
