Unified methods for VLSI simulation and test generation
By: Cheng, Kwang-ting.
Material type: BookPublisher: Dordrecht Kluwer Academic Publishers 1989Description: xii, 148p.Subject(s): VLSI -- Simulation | Test generationDDC classification: 621.395 | C421uItem type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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Books | PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.395 C421u (Browse shelf) | Book Request | Available | A107308 |
Total holds: 0
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621.395 B223P PARALLEL ALGORITHMS FOR VLSI COMPUTER-AIDED DESIGN | 621.395 B461s Scalable hardware verification with symbolic simulation | 621.395 C421E ELECTROTHERMAL ANALYSIS OF VLSI SYSTEMS | 621.395 C421u Unified methods for VLSI simulation and test generation | 621.395 C738 Comprehensive semiconductor science and technology [6 v.] | 621.395 C738 Comprehensive semiconductor science and technology [6 v.] | 621.395 C738 Comprehensive semiconductor science and technology [6 v.] |
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