Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM [2nd ed.]
By: Egerton, R. F.
Publisher: Switzerland Springer 2016Edition: 2nd ed.Description: xi, 196p.ISBN: 9783319398761.Subject(s): Electron microscopyDDC classification: 502.825 | Eg26p2| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
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Text Books
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PK Kelkar Library, IIT Kanpur | TEXT | 502.825 Eg26p2 (Browse shelf) | Available | A182978 |
Total holds: 0
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