000 -LEADER |
fixed length control field |
00559 a2200205 4500 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
OSt |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20230518113035.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
170125b xxu||||| |||| 00| 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
ISBN |
9783319398761 |
040 ## - CATALOGING SOURCE |
Transcribing agency |
IITK |
041 ## - LANGUAGE CODE |
Language code of text/sound track or separate title |
eng |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
502.825 |
Item number |
Eg26p2 |
100 ## - MAIN ENTRY--AUTHOR NAME |
Personal name |
Egerton, R. F. |
245 ## - TITLE STATEMENT |
Title |
Physical principles of electron microscopy |
Remainder of title |
an introduction to TEM, SEM, and AEM [2nd ed.] |
Statement of responsibility, etc |
R. F. Egerton |
250 ## - EDITION STATEMENT |
Edition statement |
2nd ed. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication |
Switzerland |
Name of publisher |
Springer |
Year of publication |
2016 |
300 ## - PHYSICAL DESCRIPTION |
Number of Pages |
xi, 196p |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Term |
Electron microscopy |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
Books |