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621.382
Aliev, Telman.
       Digital Noise Monitoring of Defect Origin [electronic resource] / / by Telman Aliev. .- XII, 224 p.. online resource.
TK5102.9 TA1637-1638 TK7882.S65
ISBN: 9780387717548
10.1007/978-0-387-71754-8 doi
Subject Headings:
Engineering.;
Applied mathematics.;
Engineering mathematics.;
Electrical engineering.;
Engineering.;
Signal, Image and Speech Processing.;
Applications of Mathematics.;
Communications Engineering, Networks.;
Electrical Engineering.;
Copy Details:
Acc. No.: EBK9828, Full Call No.: , Item type: E books , Location: ,
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