Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM /
By: Egerton, Ray F [author.].
Contributor(s): SpringerLink (Online service).
Material type:
BookPublisher: Boston, MA : Springer US : Imprint: Springer, 2005.Description: XII, 202 p. 122 illus. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9780387260167.Subject(s): Materials science | Microscopy | Nanotechnology | Materials Science | Characterization and Evaluation of Materials | Nanotechnology | Biological MicroscopyDDC classification: 620.11 Online resources: Click here to access online | Item type | Current location | Call number | Status | Date due | Barcode | Item holds |
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E books
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PK Kelkar Library, IIT Kanpur | Available | EBK8462 |
An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Recent Developments.
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
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