620.11
Egerton, Ray F.
Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM / [electronic resource] : / by Ray F. Egerton. .- XII, 202 p. 122 illus.. online resource.
TA404.6
ISBN: 9780387260167
10.1007/b136495 doi
Subject Headings:
Materials science.;
Microscopy.;
Nanotechnology.;
Materials Science.;
Characterization and Evaluation of Materials.;
Nanotechnology.;
Biological Microscopy.;
Copy Details:
Acc. No.: EBK8462, Full Call No.: , Item type: E books , Location: ,
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Egerton, Ray F.
Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM / [electronic resource] : / by Ray F. Egerton. .- XII, 202 p. 122 illus.. online resource.
TA404.6
ISBN: 9780387260167
10.1007/b136495 doi
Subject Headings:
Materials science.;
Microscopy.;
Nanotechnology.;
Materials Science.;
Characterization and Evaluation of Materials.;
Nanotechnology.;
Biological Microscopy.;
Copy Details:
Acc. No.: EBK8462, Full Call No.: , Item type: E books , Location: ,
------------------------- --------------------- ------ --------- ------- ------- --------- --------