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Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons /

By: Schubert, Mathias [author.].
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Springer Tracts in Modern Physics: 209Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.Description: XI, 196 p. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783540447016.Subject(s): Physics | Optics | Electrodynamics | Optoelectronics | Plasmons (Physics) | Engineering | Optical materials | Electronic materials | Materials -- Surfaces | Thin films | Physics | Optics and Electrodynamics | Surfaces and Interfaces, Thin Films | Optical and Electronic Materials | Optics, Optoelectronics, Plasmonics and Optical Devices | Engineering, generalDDC classification: 535.2 | 537.6 Online resources: Click here to access online
Contents:
Introduction -- Ellipsometry -- Infrared Model Dielectric Functions -- Polaritons in Semiconductor Layer Structures -- Anisotropic Substrates -- Zinsblende-Structure Materials (III-V) -- Wurtzite-Structure Materials (Group-III Nitrides, ZnO) -- Magneto-optic Ellipsometry.
In: Springer eBooksSummary: The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
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E books E books PK Kelkar Library, IIT Kanpur
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Introduction -- Ellipsometry -- Infrared Model Dielectric Functions -- Polaritons in Semiconductor Layer Structures -- Anisotropic Substrates -- Zinsblende-Structure Materials (III-V) -- Wurtzite-Structure Materials (Group-III Nitrides, ZnO) -- Magneto-optic Ellipsometry.

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

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