000 -LEADER |
fixed length control field |
03096nam a22006135i 4500 |
001 - CONTROL NUMBER |
control field |
978-3-540-44701-6 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
DE-He213 |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20161121230953.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
100729s2005 gw | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9783540447016 |
-- |
978-3-540-44701-6 |
024 7# - OTHER STANDARD IDENTIFIER |
Standard number or code |
10.1007/b11964 |
Source of number or code |
doi |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
QC350-467 |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
QC630-648 |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
PHJ |
Source |
bicssc |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
PHK |
Source |
bicssc |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
SCI021000 |
Source |
bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
535.2 |
Edition number |
23 |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
537.6 |
Edition number |
23 |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Schubert, Mathias. |
Relator term |
author. |
245 10 - TITLE STATEMENT |
Title |
Infrared Ellipsometry on Semiconductor Layer Structures |
Medium |
[electronic resource] : |
Remainder of title |
Phonons, Plasmons, and Polaritons / |
Statement of responsibility, etc. |
by Mathias Schubert. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
Place of production, publication, distribution, manufacture |
Berlin, Heidelberg : |
Name of producer, publisher, distributor, manufacturer |
Springer Berlin Heidelberg, |
Date of production, publication, distribution, manufacture, or copyright notice |
2005. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
XI, 196 p. |
Other physical details |
online resource. |
336 ## - CONTENT TYPE |
Content type term |
text |
Content type code |
txt |
Source |
rdacontent |
337 ## - MEDIA TYPE |
Media type term |
computer |
Media type code |
c |
Source |
rdamedia |
338 ## - CARRIER TYPE |
Carrier type term |
online resource |
Carrier type code |
cr |
Source |
rdacarrier |
347 ## - DIGITAL FILE CHARACTERISTICS |
File type |
text file |
Encoding format |
PDF |
Source |
rda |
490 1# - SERIES STATEMENT |
Series statement |
Springer Tracts in Modern Physics, |
International Standard Serial Number |
0081-3869 ; |
Volume/sequential designation |
209 |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Introduction -- Ellipsometry -- Infrared Model Dielectric Functions -- Polaritons in Semiconductor Layer Structures -- Anisotropic Substrates -- Zinsblende-Structure Materials (III-V) -- Wurtzite-Structure Materials (Group-III Nitrides, ZnO) -- Magneto-optic Ellipsometry. |
520 ## - SUMMARY, ETC. |
Summary, etc. |
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Physics. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Optics. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Electrodynamics. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Optoelectronics. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Plasmons (Physics). |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Engineering. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Optical materials. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Electronic materials. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Materials |
General subdivision |
Surfaces. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Thin films. |
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Physics. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Optics and Electrodynamics. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Surfaces and Interfaces, Thin Films. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Optical and Electronic Materials. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Optics, Optoelectronics, Plasmonics and Optical Devices. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Engineering, general. |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Relationship information |
Printed edition: |
International Standard Book Number |
9783540232490 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
Uniform title |
Springer Tracts in Modern Physics, |
International Standard Serial Number |
0081-3869 ; |
Volume/sequential designation |
209 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
http://dx.doi.org/10.1007/b11964 |
912 ## - |
-- |
ZDB-2-PHA |