Gettering and defect engineering in semicaonductor technology XII (GADEST-2007) : 12th International Autumn Meeting, EMFCSC, Erice, Italy, October 14-19, 2007 : proceedings...
By: 12th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology-GADEST 2007. Erice, Italy.
Contributor(s): Cavallini, A., Ed | .
Material type:
ArticleSeries: Diffusion And Defect Data. Publisher: Switzerland Trans Tech Publications 2008Description: xv, 642p.ISBN: 9783908451433.Subject(s): Solid State ElectronicsDDC classification: 620.38152 | In8g
| Item type | Current location | Collection | Call number | url | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 620.38152 In8g (Browse shelf) | Book Request | 2007 | Available | A162014 |
Total holds: 0
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| 620.37 C42V VIBRATION AND DAMPING IN DISTRIBUTED SYSTEMS | 620.37 M118s SEISMIC MOUNTINGS FOR VIBRATION ISOLATION | 620.381 H18N AN ANALOG ELECTRONICS COMPANION | 620.38152 In8g Gettering and defect engineering in semicaonductor technology XII (GADEST-2007) | 620.4 AL54p PARTICLE SIZE MEASUREMENT | 620.4 C114p PARTICLE SIZE | 620.4 C114p PARTICLE SIZE |
Includes bibliographical references and index.
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