000 -LEADER |
fixed length control field |
00810naa a2200181 a 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9783908451433 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620.38152 |
Item number |
In8g |
111 ## - MAIN ENTRY--MEETING NAME |
Meeting name or jurisdiction name as entry element |
International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology-GADEST 2007. |
Location of meeting |
Erice, Italy |
Date of meeting |
2007 |
Number of part/section/meeting |
12th |
245 1# - TITLE STATEMENT |
Title |
Gettering and defect engineering in semicaonductor technology XII (GADEST-2007) |
Remainder of title |
12th International Autumn Meeting, EMFCSC, Erice, Italy, October 14-19, 2007 : proceedings... |
Statement of responsibility, etc. |
edited by A. Cavallini...[et al.] |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
Switzerland |
Name of publisher, distributor, etc. |
Trans Tech Publications |
Date of publication, distribution, etc. |
2008 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xv, 642p |
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
Title |
Diffusion And Defect Data. |
Volume/sequential designation |
|
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes bibliographical references and index. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Solid State Electronics |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Cavallini, A., Ed. |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
|
997 ## - |
-- |
A162014 2007 s C |