BEAM INJECTION ASESSMENT OF DEFECTS IN SEMICONDUCTORS
By: M No Kittler.
Contributor(s): Kittler,M | .
Publisher: Scitech Publishing,Mendham, N.J. 1998Description: xiv,537.ISBN: 390845039X.Subject(s): Semiconductors -- CongressesDDC classification: 621.38152 | IN8Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 IN8 (Browse shelf) | Book Request | Available | A129623 |
Total holds: 0
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621.38152 In8 INTRODUCTION TO SEMICONDUCTOR TECHNOLOGY | 621.38152 In8 ION IMPLANTATION IN SEMICONDUCTORS | 621.38152 IN8 WAFER SCALE INTEGRATION | 621.38152 IN8 BEAM INJECTION ASESSMENT OF DEFECTS IN SEMICONDUCTORS | 621.38152 IN82 GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, GADEST 2003 | 621.38152 In8a APPLICATIONS OF ION BEAMS TO MATERIALS | 621.38152 IN8A ULTRAFAST PHENOMENA IN SEMICONDUCTORS |
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