NONDESTRUCTIVE EVALUATION OF SEMICONDUCTOR MATERIALS AND DEVICES
Contributor(s): Zemel, Jay N | .
Series: Nato Advanced Study Institutes Series. Publisher: New York Plenum 1979Description: xi,782.Subject(s): Semiconductors -- Testing -- CongressesDDC classification: 621.38152 | N811nItem type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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Books | PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 N811n (Browse shelf) | Book Request | Available | A64654 |
Total holds: 0
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621.38152 M931C COPPER-FUNDAMENTAL MECHANISMS FOR MICROELECTRONIC APPLICATIONS | 621.38152 N131 THEORY OF ELECTRICAL TRANSPORT IN SEMICONDUCTORS | 621.38152 N157P NANOSCALE PHENOMENA IN FERROELECTRIC THIN FILMS | 621.38152 N811n NONDESTRUCTIVE EVALUATION OF SEMICONDUCTOR MATERIALS AND DEVICES | 621.38152 Ox3 Oxide semiconductors | 621.38152 P12 PACKAGING OF POWER SEMICONDUCTOR DEVICES | 621.38152 P153n Nanoparticle engineering for chemical-mechanical planarization |
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