000 -LEADER |
fixed length control field |
00593 a2200169 4500 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.38152 |
Item number |
N811n |
245 1# - TITLE STATEMENT |
Title |
NONDESTRUCTIVE EVALUATION OF SEMICONDUCTOR MATERIALS AND DEVICES |
Statement of responsibility, etc. |
NATO ADVANCED STUDY INSTITUTE IN NONDISTRUCTIVE EVALUATION OF SEMICONDUCTOR MATERIALS AND DEVICES (1978 : VILLA TUSCOLANO, ITALY) |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
New York |
Name of publisher, distributor, etc. |
Plenum |
Date of publication, distribution, etc. |
1979 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xi,782 |
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
Title |
Nato Advanced Study Institutes Series |
Volume/sequential designation |
|
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Semiconductors -- Testing -- Congresses |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Zemel, Jay N. |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
|
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) |
h |
1978 |
964 ## - |
-- |
CIRC |
997 ## - |
-- |
A64654 s C |