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X-ray microscopy and x-ray microanalysis : proceedings...

By: 1960 Proceedings of the Second International Conference on X-Ray Microscopy and X-Ray Microanalysis Stockholm 2nd.
Publisher: Amsterdam Elsevier Publishing 1960Description: x, 535p.Subject(s): X-ray microscopy | X-ray microanalysisDDC classification: 578 | Sy6x
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Item type Current location Collection Call number Copy number Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur
General Stacks 578 Sy6x (Browse shelf) v. 2 Available 10920
Total holds: 0

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