| 000 -LEADER |
|---|
| fixed length control field |
00570 a2200145 4500 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
P K Kelkar Library, IIT Kanpur |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
578 |
| Item number |
Sy6x |
| 111 ## - MAIN ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
Proceedings of the Second International Conference on X-Ray Microscopy and X-Ray Microanalysis |
| Number [OBSOLETE] |
Stockholm |
| Date of meeting |
2nd |
| Number of part/section/meeting |
1960 |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
X-ray microscopy and x-ray microanalysis |
| Remainder of title |
proceedings... |
| Statement of responsibility, etc. |
edited by A. Engstrom, Y. Cosslett and H. Pattee |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Amsterdam |
| Name of publisher, distributor, etc. |
Elsevier Publishing |
| Date of publication, distribution, etc. |
1960 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
x, 535p |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
X-ray microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
X-ray microanalysis |
| 997 ## - |
|---|
| -- |
10920 v. 2 C |
