THIRD INTERNATIONAL SYMPOSIUM ON X-RAY OPTICS AND X-RAY MICROANALYSIS HELD AT STANFORD UNIVERSITY. AUGUST 22-24, 1962
By: Pattee, H. H.
Material type:
BookPublisher: London Academic Press 1964DDC classification: 537.535 | P277x
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 537.535 P277x (Browse shelf) | Book Request | Available | 27059 |
Total holds: 0
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| 537.535 G959 X-RAY DATA BOOK FOR ANALYSIS OF LAUE AND POWDER DIFFRACTION PATTERNS | 537.535 In2 Proceedings of the Sixth International Conference on X-Ray Optics and Microanalysis | 537.535 In2 X-RAY OPTICS AND MICROANALYSIS | 537.535 P277x THIRD INTERNATIONAL SYMPOSIUM ON X-RAY OPTICS AND X-RAY MICROANALYSIS HELD AT STANFORD UNIVERSITY. AUGUST 22-24, 1962 | 537.535028 B669s SELECTED SCIENTIFIC PAPERS | 537.5352 Am35pd POWDER DIFFRACTION FILE | 537.5352 Am35pd POWER DIFFRACTION FILE |
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