THIRD INTERNATIONAL SYMPOSIUM ON X-RAY OPTICS AND X-RAY MICROANALYSIS HELD AT STANFORD UNIVERSITY. AUGUST 22-24, 1962
By: Pattee, H. H.
Material type: BookPublisher: London Academic Press 1964DDC classification: 537.535 | P277xItem type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 537.535 P277x (Browse shelf) | Book Request | Available | 27059 |
Total holds: 0
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