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THE MEASUREMENT AND ANALYSIS OF PILOT SCANNING AND CONTROL BEHAVIOR DURING SIMULATED INSTRUMENT APPROACHES

By: Weir,David H.
Contributor(s): Klein,Richard H.
Material type: materialTypeLabelBookPublisher: Nasa, Washington, D.C. 1970Description: XII,100.DDC classification: NASA | CR-1535 -
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Bound With Nasa Cr-1531-39

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