THE MEASUREMENT AND ANALYSIS OF PILOT SCANNING AND CONTROL BEHAVIOR DURING SIMULATED INSTRUMENT APPROACHES
By: Weir,David H.
Contributor(s): Klein,Richard H.
Material type:
BookPublisher: Nasa, Washington, D.C. 1970Description: XII,100.DDC classification: NASA | CR-1535 -
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Technical Report
|
PK Kelkar Library, IIT Kanpur | General Stacks | NASA CR-1535 - (Browse shelf) | Not for loan | TR9300 |
Total holds: 0
Bound With Nasa Cr-1531-39
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