X - ray microscopy and x- ray microanalysis : proceedings...
By: 2nd International Symposium on X - Ray Microscopy and Microradiography Cambridge, England.
Contributor(s): Engstrom, A [ed.] | Cosslett, V [ed.] | Pattee, H [ed.].
Material type:
BookPublisher: Amsterdam Elsevier Publishing 1960Description: x, 540p.Subject(s): Microradiography | X - ray microanalysisDDC classification: 578 | Sy6x v.2
| Item type | Current location | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 578 Sy6x (Browse shelf) | v.2 | Available | K9562 |
Total holds: 0
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