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X - ray microscopy and x- ray microanalysis (Record no. 386772)

000 -LEADER
fixed length control field 00717pam a2200217a 44500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20161202122117.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 161202b xxu||||| |||| 00| 0 eng d
040 ## - CATALOGING SOURCE
Transcribing agency IITK
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 578
Item number Sy6x v.2
111 ## - MAIN ENTRY--MEETING NAME
Meeting name or jurisdiction name as entry element International Symposium on X - Ray Microscopy and Microradiography
Location of meeting Cambridge, England
Date of meeting 1959
Number of part/section/meeting 2nd
245 1# - TITLE STATEMENT
Title X - ray microscopy and x- ray microanalysis
Remainder of title proceedings...
Statement of responsibility, etc edited by A. Engstrom, V. Cosslett and H. Pattee
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication Amsterdam
Name of publisher Elsevier Publishing
Year of publication 1960
300 ## - PHYSICAL DESCRIPTION
Number of Pages x, 540p
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Microradiography
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term X - ray microanalysis
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Engstrom, A [ed.]
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Cosslett, V [ed.]
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Pattee, H [ed.]
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Permanent Location Current Location Date acquired Serial Enumeration / chronology Full call number Accession Number Koha item type
        General Stacks PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 2012-07-08 v.2 578 Sy6x K9562 Books

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