Fringe pattern analysis for optical metrology : theory, algorithms, and applications
By: Servin, Manuel.
Contributor(s): Quiroga, J. Antonio.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | General Stacks | 535.470287 Se69f (Browse shelf) | Available | A180207 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
535.470287 H225O2 OPTICAL INTERFEROMETRY | 535.470287 In8 Interferometry principles and applications | 535.470287 P495 Phase estimation in optical interferometry | 535.470287 Se69f Fringe pattern analysis for optical metrology | 535.470287 Z615o Optical frequency-modulated continuous-wave(FMCW) interferometry | 535.5 Ap58 APPLIED CHARGED PARTICLE OPTICS | 535.5 B621n NONLINEAR OPTICS |
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