Fringe pattern analysis for optical metrology : theory, algorithms, and applications
By: Servin, Manuel.
Contributor(s): Quiroga, J. Antonio.
Material type:
BookPublisher: Germany Wiley-Vch 2014Description: xvi, 327p.ISBN: 9783527411528.Subject(s): Optical measurements | Diffraction patterns | InterferometryDDC classification: 535.470287 | Se69f
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 535.470287 Se69f (Browse shelf) | Available | A180207 |
Total holds: 0
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