Nanometer technology designs high-quality delay tests
By: Tehranipoor, Mohammad.
Contributor(s): Ahmed, Nisar.
Material type: BookPublisher: New York Springer 2008Description: xvii, 281p.ISBN: 9780387764863.Subject(s): Nanotechnology | Integrated circuits--Testing | Integrated circuits--Very large scale integration | Computer engineeringComputer-aided design | Systems engineeringDDC classification: 621.381548 | T233nItem type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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Books | PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381548 T233n (Browse shelf) | Book Request | Available | A177610 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
621.381548 R542A ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS | 621.381548 St76a ATE | 621.381548 T233m Test and diagnosis for small-delay defects | 621.381548 T233n Nanometer technology designs high-quality delay tests | 621.381548 W391E ELECTRICAL MEASUREMENT, SIGNAL PROCESSING, AND DISPLAYS | 621.3815486 C42f Frequency synthesizers | 621.3815486 R636M MICROWAVE AND WIRELESS SYNTHESIZERS |
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