Microelectronic reliability
By: .
Contributor(s): Hakim, Edward B., Ed.
Material type:
BookPublisher: Norwood Artech House 1989Description: xviii, 374p.ISBN: 0890062846.Subject(s): Semiconductors--ReliabilityDDC classification: 621.38152 | M583
Contents:
Contents: Vol.1 - Reliability, test and diagnostics
| Item type | Current location | Collection | Call number | url | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 M583 (Browse shelf) | Book Request | vol.1 | Available | A107346 |
Total holds: 0
Contents: Vol.1 - Reliability, test and diagnostics
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