| 000 -LEADER |
|---|
| fixed length control field |
00571pam a2200181a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b1989 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0890062846 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
IIT, Kanpur |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.38152 |
| Item number |
M583 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
|
| 245 0# - TITLE STATEMENT |
|---|
| Title |
Microelectronic reliability |
| Statement of responsibility, etc. |
edited by Edward B. Hakim |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Norwood |
| Name of publisher, distributor, etc. |
Artech House |
| Date of publication, distribution, etc. |
1989 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xviii, 374p. |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Contents: Vol.1 - Reliability, test and diagnostics |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors--Reliability |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Hakim, Edward B., Ed. |
| 997 ## - |
|---|
| -- |
A107346 vol.1 s C |
