Data modeling for metrology and testing in measurement science
By: .
Contributor(s): Pavese, Franco, Ed.
Material type: BookSeries: Modeling And Simulation In Science, Engineering And Technology / Edited By Nicola Bellomo. Publisher: Boston Birkhauser 2009Description: xvii, 489p.ISBN: 9780817645922.Subject(s): MetrologyDDC classification: 511.8 | D262Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 511.8 D262 (Browse shelf) | Available | A166251 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
511.8 C417 CELLULAR AUTOMATA | 511.8 C497m3 MATHEMATICS OF FINANCE | 511.8 C591m MATHEMATICAL MODELLING | 511.8 D262 Data modeling for metrology and testing in measurement science | 511.8 D993P2 PRINCIPLES OF MATHEMATICAL MODELING | 511.8 ED96G2 GUIDE TO MATHEMATICAL MODELLING | 511.8 En32 INTRODUCTION TO THE THEORY OF COMPUTATION |
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