Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis
By: Echlin, Patrick.
Material type: BookPublisher: New York Springer 2009Description: xi, 330p.ISBN: 9780387857305.Subject(s): Scanning electron microscopyDDC classification: 502.285 | Ec43hItem type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 502.285 Ec43h (Browse shelf) | Available | A165816 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
501.5192 C679F FROM COSMOS TO CHAOS | 501.8 R182s SCIENCE | 501.8 Si53m MODELS OF DISCOVERY AND OTHER TOPICS IN THE METHODS OF SCIENCE | 502.285 Ec43h Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis | 502.3 B72T TO BE A SCIENTIST | 502.7 El59e The essential guide to effect sizes | 502.8 B771i AN INTRODUCTION TO EXPERIMENTATION |
There are no comments for this item.