| 000 -LEADER |
|---|
| fixed length control field |
00526pam a2200157a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b2009 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9780387857305 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
IIT, Kanpur |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
502.285 |
| Item number |
Ec43h |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Echlin, Patrick |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
| Statement of responsibility, etc. |
Patrick Echlin |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New York |
| Name of publisher, distributor, etc. |
Springer |
| Date of publication, distribution, etc. |
2009 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xi, 330p |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Scanning electron microscopy. |
| 997 ## - |
|---|
| -- |
A165816 Direct C |
