Defects in microelectronic materials and devices
By: .
Contributor(s): Fleetwood, Daniel M., Ed.
Material type:
BookPublisher: Boca Raton Crc Press 2009Description: xvi, 753p.ISBN: 9781420043761.Subject(s): Microelectronics - Materials - Testing | Integrated circuits - DefectsDDC classification: 621.381 | D361
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.381 D361 (Browse shelf) | Available | A165011 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| 621.381 C334 CERAMIC DIELECTRICS | 621.381 C338m2 Mechatronics with experiments | 621.381 C864s Silicon earth | 621.381 D361 Defects in microelectronic materials and devices | 621.381 D786N NANOELECTRONICS | 621.381 D786n2 Nanoelectronics | 621.381 D873d Designing electronic systems for EMC |
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