Applied scanning probe methods VIII : scanning probe microscopy techniques
By: .
Contributor(s): Bhushan, Bharat, Ed.
Material type: BookPublisher: Berlin Springer-Verlag 2008Description: Lix, 465p.ISBN: 9783540740797.Subject(s): Materials -- MicroscopyDDC classification: 620.11299 | Ap58Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 620.11299 Ap58 (Browse shelf) | Available | A161717 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
620.112973 M418 MATERIALS SCIENCE IN STATIC HIGH MAGNETIC FIELDS | 620.112973 Si55s SUPERCONDUCTORS | 620.11299 A35s SURFACE ALLOYING BY ION ELECTRON AND LASER BEAMS | 620.11299 Ap58 Applied scanning probe methods VIII | 620.11299 C420 Chemistry of nanocrystalline oxide materials | 620.11299 C55M MICROSCOPY TECHNIQUES FOR MATERIALS SCIENCE | 620.11299 Eb36aE STRUCTURAL AND CHEMICAL ANALYSIS OF MATERIALS |
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