| 000 -LEADER |
|---|
| fixed length control field |
00573pam a2200169a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b2008 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783540740797 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
P K Kelkar Library, IIT Kanpur |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.11299 |
| Item number |
Ap58 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
|
| 245 1# - TITLE STATEMENT |
|---|
| Title |
Applied scanning probe methods VIII |
| Remainder of title |
scanning probe microscopy techniques |
| Statement of responsibility, etc. |
ed. by Bharat Bhushan, Harald Fuchs, and Masahiko Tomitori |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Berlin |
| Name of publisher, distributor, etc. |
Springer-Verlag |
| Date of publication, distribution, etc. |
2008 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
Lix, 465p. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Materials -- Microscopy |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Bhushan, Bharat, Ed. |
| 997 ## - |
|---|
| -- |
A161717 C |
