Transmission electron microscopy and diffractometry of materials [3rd ed.]
Material type: BookPublisher: Berlin Springer-Verlag 2008Edition: 3rd ed.Description: xix, 758p.ISBN: 9783540738855.Subject(s): Materials -- Microscopy | Transmission electron microscopy | X-Ray diffractometerDDC classification: 620.11299 | F959t3Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|
Text Books | PK Kelkar Library, IIT Kanpur | TEXT | 620.11299 F959t3 (Browse shelf) | Available | A160731 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: TEXT Close shelf browser
620.11297 So47e7 Electrical properties of materials [7th ed.] | 620.11299 B734m2 cop.2 Microstructural characterization of materials [2nd ed.] | 620.11299 B734m2 cop.3 Microstructural characterization of materials [2nd ed.] | 620.11299 F959t3 Transmission electron microscopy and diffractometry of materials [3rd ed.] | 620.11299 G756I Introduction to conventionaltransmission electron mictroscopy | 620.11299 H192 HANDBOOK OF NANOPHASE AND NANOSTRUCTURED MATERIALS | 620.11299 H192 HANDBOOK OF NANOPHASE AND NANOSTRUCTURED MATERIALS |
There are no comments for this item.