DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS
By: Sachdev,Manoj,Gyvez,Jose Pineda De.
Contributor(s): Agarwal,Vishwani D.
Material type:
BookSeries: Frontiers In Electronic Testing. Publisher: Springer,Aa Dordrecht 2007Edition: 2nd.Description: xx,328.ISBN: 9780387465463.Subject(s): Metaloxide Semiconductors, Complementary -- Testing | Metaloxide Semiconductors, Complementary -- Defects | Integrated Circuits -- Very Largescale Integration -- TestingDDC classification: 621.3815 | SA14D2
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.3815 SA14D2 (Browse shelf) | Book Request | Available | A159498 |
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