| 000 -LEADER |
|---|
| fixed length control field |
00739pam a2200217a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b2007 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9780387465463 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.3815 |
| Item number |
SA14D2 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Sachdev,Manoj,Gyvez,Jose Pineda De |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
DEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
2nd |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
|
| Name of publisher, distributor, etc. |
Springer,Aa Dordrecht |
| Date of publication, distribution, etc. |
2007 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xx,328 |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
Frontiers In Electronic Testing |
| Volume/sequential designation |
|
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Metaloxide Semiconductors, Complementary -- Testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Metaloxide Semiconductors, Complementary -- Defects |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated Circuits -- Very Largescale Integration -- Testing |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Agarwal,Vishwani D. |
| 964 ## - |
|---|
| -- |
CIRC |
| 997 ## - |
|---|
| -- |
A159498 s C |
