SCANNING MICROSCOPY FOR NANOTECHNOLOGY
By: Zhou,Weilie.
Contributor(s): Wang,Zhong Lin.
Material type:
BookPublisher: Springer Science+Business Media Inc., New York 2007Description: xiv,522.ISBN: 0387333258.Subject(s): Scanning Electron Microscopy | NanotechnologyDDC classification: 502.825 | SC63M
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 SC63M (Browse shelf) | Available | A157625 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| 502.825 Sa47 Sample preparation handbook for transmission electron microscopy | 502.825 SC63 SCANNING PROBE MICROSCOPY | 502.825 SC63 SCANNING PROBE MICROSCOPY | 502.825 SC63M SCANNING MICROSCOPY FOR NANOTECHNOLOGY | 502.825 Sca63 Scanning transmission electron microscopy of nanomaterials | 502.825 W341P2 PRINCIPLES AND PRACTICE OF ELECTRON MISCROSCOPY | 502.85 G151s Scientific computing |
There are no comments for this item.