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SCANNING MICROSCOPY FOR NANOTECHNOLOGY (Record no. 355922)

000 -LEADER
fixed length control field 00532pam a2200181a 44500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 160408b2007 xxu||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0387333258
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 502.825
Item number SC63M
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Zhou,Weilie
245 1# - TITLE STATEMENT
Title SCANNING MICROSCOPY FOR NANOTECHNOLOGY
Statement of responsibility, etc. TECHNIQUES AND APPLICATIONS
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.
Name of publisher, distributor, etc. Springer Science+Business Media Inc., New York
Date of publication, distribution, etc. 2007
300 ## - PHYSICAL DESCRIPTION
Extent xiv,522
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Scanning Electron Microscopy
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Nanotechnology
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Wang,Zhong Lin
964 ## -
-- CIRC
997 ## -
-- A157625 C
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Permanent Location Current Location Date acquired Full call number Barcode Date last seen Price effective from Koha item type
        General Stacks PK Kelkar Library, IIT Kanpur PK Kelkar Library, IIT Kanpur 2007-08-12 502.825 SC63M A157625 2016-04-08 2016-04-08 Books

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